On-Site Drug Testing Sims, AR
Time is money, we can come to you. Accredited Drug Testing provides on-site drug testing services in Sims, AR and throughout the local area for employers who need drug or alcohol testing at their place of business or other location. On-site drug testing methods include urine drug testing, hair drug testing, oral saliva drug testing and breath alcohol testing. Both instant drug test results and laboratory analyzed testing is available. Testing purposes can include pre-employment, random, reasonable suspicion and post-accident.
Drug Test Screening Panels Available In Sims, AR
We offer a 5-panel drug test, which screens for the following:
- Amphetamines
- Cocaine
- Marijuana
- Opiates
- PCP
We offer a 10-panel drug test which screens for the following:
- Amphetamines
- Barbituates
- Benzodiazepines
- cocaine
- Marijuana
- MDA
- Methadone
- Methaqualone
- Opiates
- PCP
- Propoxyphene
We offer a 12-panel drug test which screens for the following:
- Amphetamines
- Barbiturates
- Benzodiazepines
- cocaine
- Marijuana
- MDA
- Methadone
- Methaqualone
- Opiates
- PCP
- Propoxyphene
- Meperidine
- Tramadol
** Customized drug testing panels such as bath salts, synthetic marijuana, steroids and other drugs are also available.
Urine or Hair On-site Drug Testing In Sims, AR - You Choose!
Our on-site drug testing services in Sims, AR include urine drug testing, which has a detection period of 1-5 days and hair drug testing which has a detection period of up to 90 days. Negative test results are generally available in 24-48 hours, when analyzed by our SAMHSA Certified Laboratories. Negative instant test results are available immediately, non-negative test results require laboratory confirmation.
Why Use On-Site Drug Testing in Sims, AR?
Time is money and when sending an employee to one of our many drug testing centers in Sims, AR would cause disruption to your business operations or affect your employees work productivity, conducting on-site drug testing will eliminate these issues.
Who Uses On-Site Drug Testing?
- Construction Sites
- Manufacturing Plants
- Power Plants
- Motor Pool Facilities
- Car Dealerships
- Trucking/Transportation Companies
- Schools
- Sports Venues
- Hospitals
- Oil & Gas Drillings Sites
Are you a DOT Regulated Company?
Accredited Drug Testing has trained and qualified collectors who also specialize in providing on-site drug testing services for all DOT modes to include:
- Trucking Industry-FMCSA
- Maritime Industry-USCG
- Aviation Industry-FAA
- Public Transportation-FTA
- Railroad Industry-FRA
- Pipeline Industry-PHMSA
Additional DOT Services:
- DOT Consortium Enrollment
- DOT Physicals
- Supervisor Training
- DOT Drug Policy Development
- MVR Reports
- Employee Training
- Background Checks
- FMCSA Clearinghouse Verification/Search
How To Schedule On-Site Drug Testing In Sims, AR?
Step 1 - Call our on-site coordinator at (800)221-4291
Step 2 - Have at least 10 employees needing to be tested (recommended)
Step 3 - Provide the date, location and time of the requested on-site drug testing services
In addition to on-site drug testing in Sims, AR, we also have drug testing centers available at the following locations.
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Local Area Info: Secondary ion mass spectrometry
Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm. Due to the large variation in ionization probabilities among different materials, SIMS is generally considered to be a qualitative technique, although quantitation is possible with the use of standards. SIMS is the most sensitive surface analysis technique, with elemental detection limits ranging from parts per million to parts per billion.
In 1910 British physicist J. J. Thomson observed a release of positive ions and neutral atoms from a solid surface induced by ion bombardment. Improved vacuum pump technology in the 1940s enabled the first prototype experiments on SIMS by Herzog and Viehböck in 1949, at the University of Vienna, Austria. In the mid-1950s Honig constructed a SIMS instrument at RCA Laboratories in Princeton, New Jersey. Then in the early 1960s two SIMS instruments were developed independently. One was an American project, led by Liebel and Herzog, which was sponsored by NASA at GCA Corp, Massachusetts, for analyzing moon rocks, the other at the University of Paris-Sud in Orsay by R. Castaing for the PhD thesis of G. Slodzian. These first instruments were based on a magnetic double focusing sector field mass spectrometer and used argon for the primary beam ions. In the 1970s, K. Wittmaack and C. Magee developed SIMS instruments equipped with quadrupole mass analyzers. Around the same time, A. Benninghoven introduced the method of static SIMS, where the primary ion current density is so small that only a negligible fraction (typically 1%) of the first surface layer is necessary for surface analysis. Instruments of this type use pulsed primary ion sources and time-of-flight mass spectrometers and were developed by Benninghoven, Niehuis and Steffens at the University of Münster, Germany and also by Charles Evans & Associates. The Castaing and Slodzian design was developed in the 1960s by the French company CAMECA S.A.S. and used in materials science and surface science.[citation needed]Recent developments are focusing on novel primary ion species like C60+, ionized clusters of gold and bismuth, or large gas cluster ion beams (e.g., Ar700+). The sensitive high resolution ion microprobe (SHRIMP) is a large-diameter, double-focusing SIMS sector instrument based on the Liebl and Herzog design, and produced by Australian Scientific Instruments in Canberra, Australia.[citation needed]
A secondary ion mass spectrometer consists of (1) a primary ion gun generating the primary ion beam, (2) a primary ion column, accelerating and focusing the beam onto the sample (and in some devices an opportunity to separate the primary ion species by Wien filter or to pulse the beam), (3) high vacuum sample chamber holding the sample and the secondary ion extraction lens, (4) a mass analyser separating the ions according to their mass-to-charge ratio, and (5) a detector.